Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
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Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression_2024_09_10/rv_dm-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

2 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[rv_dm_mem_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[rv_dm_regs_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 0 14 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_is_mem 2 0 2 100.00 100 1 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_is_mem

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 1349520 1 T2 1 T3 1 T5 3
auto[1] 201034 1 T57 80 T66 80 T12 5058



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
values[0] 1550309 1 T2 1 T3 1 T5 3
values[1] 28 1 T185 2 T174 3 T176 1
values[2] 1 1 T197 1 - - - -
values[3] 133 1 T185 7 T174 6 T176 5



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
values[0] 1550327 1 T2 1 T3 1 T5 3
values[1] 31 1 T185 2 T174 1 T176 2
values[2] 7 1 T198 1 T199 1 T200 1
values[3] 123 1 T185 6 T174 6 T176 8



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[TlIntgErrNone] 1550194 1 T2 1 T3 1 T5 3
auto[TlIntgErrCmd] 133 1 T185 9 T174 10 T176 7
auto[TlIntgErrData] 115 1 T185 6 T174 5 T176 11
auto[TlIntgErrBoth] 112 1 T185 5 T174 5 T176 2


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
[auto[1]] 0 0 - - - - - -
auto[0] 326316 0 T1 1 T2 1 T3 1



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
values[0] 326091 1 T1 1 T2 1 T3 1
values[1] 23 1 T185 2 T197 2 T201 5
values[2] 6 1 T174 1 T200 2 T202 1
values[3] 115 1 T185 4 T174 8 T176 9



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
values[0] 326078 1 T1 1 T2 1 T3 1
values[1] 34 1 T185 1 T174 3 T176 1
values[2] 9 1 T185 1 T176 1 T201 1
values[3] 106 1 T185 8 T176 5 T198 2



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[TlIntgErrNone] 325956 1 T1 1 T2 1 T3 1
auto[TlIntgErrCmd] 122 1 T185 5 T174 10 T176 9
auto[TlIntgErrData] 135 1 T185 11 T174 6 T176 5
auto[TlIntgErrBoth] 103 1 T185 4 T174 4 T176 6