Unified Coverage Report :: Group :: cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspaces/repo/scratch/os_regression_2024_09_10/spi_device_2p-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_errors_cgs_wrap[spi_device_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_errors_cgs_wrap[spi_device_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[spi_device_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	0	15	100.00

Variables for Group Instance tl_errors_cgs_wrap[spi_device_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	0	2	100.00	100	1	1	2
cp_mem_ro_err	2	0	2	100.00	100	1	1	2
cp_mem_wo_err	2	0	2	100.00	100	1	1	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

3750

1

T116

2

T117

204

T118

213

auto[1]

1194

1

T117

64

T118

79

T120

64

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

4316

1

T116

2

T117

248

T118

264

auto[1]

628

1

T117

20

T118

28

T120

41

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

4559

1

T116

2

T117

246

T118

268

auto[1]

385

1

T117

22

T118

24

T120

1

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

4941

1

T116

2

T117

268

T118

291

auto[1]

3

1

T118

1

T130

1

T193

1

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

4317

1

T116

2

T117

229

T118

250

auto[1]

627

1

T117

39

T118

42

T120

20

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

covered

893

1

T117

90

T118

36

T120

48

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

4777

1

T116

2

T117

264

T118

274

auto[1]

167

1

T117

4

T118

18

T120

2

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

3937

1

T117

239

T118

228

T120

176

auto[1]

1007

1

T116

2

T117

29

T118

64