Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
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Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression/spi_device_2p-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_errors_cgs_wrap[spi_device_reg_block] 100.00 1 100 1 64 64



Group Instance : tl_errors_cgs_wrap[spi_device_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64



Summary for Group Instance tl_errors_cgs_wrap[spi_device_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 15 0 15 100.00


Variables for Group Instance tl_errors_cgs_wrap[spi_device_reg_block]
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_csr_size_err 2 0 2 100.00 100 1 1 2
cp_instr_type_err 2 0 2 100.00 100 1 1 2
cp_mem_byte_access_err 2 0 2 100.00 100 1 1 2
cp_mem_ro_err 2 0 2 100.00 100 1 1 2
cp_mem_wo_err 2 0 2 100.00 100 1 1 2
cp_tl_protocol_err 1 0 1 100.00 100 1 1 0
cp_unmapped_err 2 0 2 100.00 100 1 1 2
cp_write_w_instr_type_err 2 0 2 100.00 100 1 1 2


Summary for Variable cp_csr_size_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_csr_size_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 3889 1 T118 114 T119 199 T120 21
auto[1] 1303 1 T118 24 T119 124 T121 58


Summary for Variable cp_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_instr_type_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 4396 1 T118 124 T119 291 T120 12
auto[1] 796 1 T118 14 T119 32 T120 9


Summary for Variable cp_mem_byte_access_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_byte_access_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 4848 1 T118 131 T119 310 T120 18
auto[1] 344 1 T118 7 T119 13 T120 3


Summary for Variable cp_mem_ro_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_ro_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 5190 1 T118 138 T119 323 T120 21
auto[1] 2 1 T132 1 T214 1 - -


Summary for Variable cp_mem_wo_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_wo_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 4577 1 T118 99 T119 284 T120 20
auto[1] 615 1 T118 39 T119 39 T120 1


Summary for Variable cp_tl_protocol_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 1 0 1 100.00


User Defined Bins for cp_tl_protocol_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
covered 711 1 T118 19 T119 48 T120 1


Summary for Variable cp_unmapped_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_unmapped_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 5042 1 T118 133 T119 315 T120 21
auto[1] 150 1 T118 5 T119 8 T121 5


Summary for Variable cp_write_w_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write_w_instr_type_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 3972 1 T118 108 T119 264 T120 14
auto[1] 1220 1 T118 30 T119 59 T120 7