Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
35.71	35.71	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[usbdev_reg_block]	35.71	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[usbdev_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
35.71	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	9	5	35.71

Variables for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	3	1	25.00	100	1	1	0
cp_num_data_err_bits	4	3	1	25.00	100	1	1	0
cp_tl_intg_err_type	4	3	1	25.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	93949	1		T1	21		T2	12		T3	8
auto[1]	22103	1		T1	18		T5	18		T32	2

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	3	1	25.00

User Defined Bins for cp_num_cmd_err_bits

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
values[1]	0	1	1
values[2]	0	1	1
values[3]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	116052	1		T1	39		T2	12		T3	8

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	3	1	25.00

User Defined Bins for cp_num_data_err_bits

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
values[1]	0	1	1
values[2]	0	1	1
values[3]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	116052	1		T1	39		T2	12		T3	8

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	3	1	25.00

Automatically Generated Bins for cp_tl_intg_err_type

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
auto[TlIntgErrCmd]	0	1	1
auto[TlIntgErrData]	0	1	1
auto[TlIntgErrBoth]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	116052	1		T1	39		T2	12		T3	8