Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
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Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
93.33 93.33 1 100 1 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression_2024_08_31/chip_earlgrey_asic-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_errors_cgs_wrap[chip_reg_block] 93.33 1 100 1 64 64




Group Instance : tl_errors_cgs_wrap[chip_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
93.33 1 100 1 64 64




Summary for Group Instance tl_errors_cgs_wrap[chip_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 15 1 14 93.33


Variables for Group Instance tl_errors_cgs_wrap[chip_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_csr_size_err 2 0 2 100.00 100 1 1 2
cp_instr_type_err 2 0 2 100.00 100 1 1 2
cp_mem_byte_access_err 2 0 2 100.00 100 1 1 2
cp_mem_ro_err 2 0 2 100.00 100 1 1 2
cp_mem_wo_err 2 0 2 100.00 100 1 1 2
cp_tl_protocol_err 1 0 1 100.00 100 1 1 0
cp_unmapped_err 2 0 2 100.00 100 1 1 2
cp_write_w_instr_type_err 2 1 1 50.00 100 1 1 2


Summary for Variable cp_csr_size_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_csr_size_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 1037 1 T257 3 T258 3 T275 3
auto[1] 36586 1 T527 1141 T528 456 T543 2476



Summary for Variable cp_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_instr_type_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 37622 1 T257 3 T258 3 T275 3
auto[1] 1 1 T550 1 - - - -



Summary for Variable cp_mem_byte_access_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_byte_access_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 37286 1 T257 3 T258 3 T275 3
auto[1] 337 1 T527 19 T528 5 T543 14



Summary for Variable cp_mem_ro_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_ro_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 37619 1 T257 3 T258 3 T275 3
auto[1] 4 1 T395 1 T555 1 T547 2



Summary for Variable cp_mem_wo_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_wo_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 37087 1 T257 3 T258 3 T275 3
auto[1] 536 1 T527 24 T528 4 T543 12



Summary for Variable cp_tl_protocol_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 1 0 1 100.00


User Defined Bins for cp_tl_protocol_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNT
covered 1 1 T635 1



Summary for Variable cp_unmapped_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_unmapped_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 37465 1 T527 1184 T528 465 T543 2502
auto[1] 158 1 T257 3 T258 3 T275 3



Summary for Variable cp_write_w_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_write_w_instr_type_err

Uncovered bins
NAMECOUNTAT LEASTNUMBERSTATUS
[auto[1]] 0 1 1


Covered bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 37623 1 T257 3 T258 3 T275 3

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