Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	27990172	1	T1	19	T2	16023	T3	165
auto[1]	5086008	1	T2	3540	T3	27	T4	24224

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	33075984	1	T1	19	T2	19563	T3	192
values[1]	16	1	T233	2	T250	2	T283	2
values[2]	4	1	T250	1	T357	1	T298	1
values[3]	97	1	T233	7	T234	4	T250	8

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	33075989	1	T1	19	T2	19563	T3	192
values[1]	28	1	T233	4	T234	1	T250	1
values[2]	9	1	T233	3	T252	1	T290	1
values[3]	86	1	T233	3	T234	2	T250	5

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[TlIntgErrNone]	33075890	1	T1	19	T2	19563	T3	192
auto[TlIntgErrCmd]	99	1	T233	8	T234	4	T250	9
auto[TlIntgErrData]	94	1	T233	6	T234	4	T250	7
auto[TlIntgErrBoth]	97	1	T233	6	T234	2	T250	4

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[0]]	0	0	-	-	-	-	-	-
auto[1]	3848348	0	T4	16641	T5	16748	T6	41353

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	3848175	1	T4	16641	T5	16748	T6	41353
values[1]	17	1	T234	1	T252	1	T299	1
values[2]	7	1	T233	2	T358	1	T357	2
values[3]	76	1	T233	4	T234	1	T250	5

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	3848164	1	T4	16641	T5	16748	T6	41353
values[1]	20	1	T233	1	T250	1	T252	2
values[2]	6	1	T233	1	T250	1	T287	1
values[3]	107	1	T233	6	T234	4	T250	6

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[TlIntgErrNone]	3848081	1	T4	16641	T5	16748	T6	41353
auto[TlIntgErrCmd]	83	1	T233	7	T234	3	T250	7
auto[TlIntgErrData]	94	1	T233	7	T234	4	T250	6
auto[TlIntgErrBoth]	90	1	T233	5	T234	3	T250	6

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	76890	0	T69	104	T70	188	T99	2112

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	76698	1	T69	104	T70	188	T99	2112
values[1]	24	1	T233	1	T250	4	T252	1
values[2]	2	1	T250	1	T299	1	-	-
values[3]	103	1	T233	8	T234	5	T250	4

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	76691	1	T69	104	T70	188	T99	2112
values[1]	16	1	T233	1	T234	1	T299	2
values[2]	8	1	T234	2	T250	1	T359	2
values[3]	94	1	T233	7	T234	3	T250	3

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[TlIntgErrNone]	76600	1	T69	104	T70	188	T99	2112
auto[TlIntgErrCmd]	91	1	T233	8	T234	3	T250	6
auto[TlIntgErrData]	98	1	T233	6	T234	2	T250	6
auto[TlIntgErrBoth]	101	1	T233	6	T234	5	T250	8