Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspaces/repo/scratch/os_regression_2024_08_24/flash_ctrl-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	24993792	1		T1	109		T2	1220		T3	453
auto[1]	5366777	1		T1	3		T2	78		T3	146

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	30360362	1		T1	112		T2	1298		T3	599
values[1]	16	1		T264	2		T265	1		T371	1
values[2]	3	1		T265	1		T372	1		T373	1
values[3]	120	1		T264	4		T265	1		T266	6

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	30360367	1		T1	112		T2	1298		T3	599
values[1]	20	1		T264	1		T266	2		T374	2
values[2]	7	1		T266	1		T373	1		T289	1
values[3]	94	1		T264	5		T265	4		T266	3

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	30360259	1		T1	112		T2	1298		T3	599
auto[TlIntgErrCmd]	108	1		T264	2		T265	3		T266	3
auto[TlIntgErrData]	103	1		T264	1		T265	5		T266	4
auto[TlIntgErrBoth]	99	1		T264	7		T265	2		T266	3

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[0]]	0	0		-	-		-	-		-	-
auto[1]	3831185	0		T8	454		T6	16		T20	10

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	3831023	1		T8	454		T6	16		T20	10
values[1]	17	1		T265	1		T374	1		T372	1
values[2]	3	1		T372	1		T375	2		-	-
values[3]	81	1		T264	5		T265	2		T266	3

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	3830983	1		T8	454		T6	16		T20	10
values[1]	21	1		T265	1		T374	1		T371	1
values[2]	9	1		T376	1		T377	2		T373	1
values[3]	108	1		T264	6		T265	4		T266	7

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	3830902	1		T8	454		T6	16		T20	10
auto[TlIntgErrCmd]	81	1		T264	3		T265	2		T266	1
auto[TlIntgErrData]	121	1		T264	2		T265	4		T266	5
auto[TlIntgErrBoth]	81	1		T264	5		T265	3		T266	3

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	87613	0		T136	591		T75	42		T76	112

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	87403	1		T136	591		T75	42		T76	112
values[1]	14	1		T265	2		T377	1		T373	1
values[2]	3	1		T373	1		T378	2		-	-
values[3]	107	1		T264	4		T265	3		T266	4

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	87400	1		T136	591		T75	42		T76	112
values[1]	16	1		T265	1		T266	1		T376	1
values[2]	6	1		T379	1		T380	1		T378	1
values[3]	106	1		T264	6		T265	6		T266	7

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	87303	1		T136	591		T75	42		T76	112
auto[TlIntgErrCmd]	97	1		T264	3		T265	2		T266	1
auto[TlIntgErrData]	100	1		T264	5		T265	2		T266	5
auto[TlIntgErrBoth]	113	1		T264	2		T265	6		T266	4