Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspaces/repo/scratch/os_regression_2024_08_26/flash_ctrl-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	27068375	1		T1	334		T2	17		T3	2577
auto[1]	4945076	1		T1	30		T3	502		T12	2008

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	32013261	1		T1	364		T2	17		T3	3079
values[1]	24	1		T254	1		T256	1		T352	1
values[2]	5	1		T353	1		T354	1		T355	1
values[3]	93	1		T254	4		T255	3		T256	3

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	32013249	1		T1	364		T2	17		T3	3079
values[1]	22	1		T254	1		T255	1		T256	2
values[2]	4	1		T353	1		T356	2		T357	1
values[3]	101	1		T254	7		T255	3		T256	2

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	32013151	1		T1	364		T2	17		T3	3079
auto[TlIntgErrCmd]	98	1		T254	2		T255	1		T256	3
auto[TlIntgErrData]	110	1		T254	4		T255	7		T256	3
auto[TlIntgErrBoth]	92	1		T254	4		T255	2		T256	4

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[0]]	0	0		-	-		-	-		-	-
auto[1]	3767349	0		T2	10		T3	275		T13	86

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	3767161	1		T2	10		T3	275		T13	86
values[1]	21	1		T255	1		T358	1		T352	1
values[2]	5	1		T256	1		T359	1		T355	2
values[3]	97	1		T254	5		T255	4		T256	4

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	3767158	1		T2	10		T3	275		T13	86
values[1]	22	1		T254	2		T255	1		T256	1
values[2]	3	1		T255	1		T360	1		T361	1
values[3]	87	1		T254	3		T255	2		T256	4

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	3767065	1		T2	10		T3	275		T13	86
auto[TlIntgErrCmd]	93	1		T254	4		T255	3		T256	5
auto[TlIntgErrData]	96	1		T254	2		T255	3		T256	2
auto[TlIntgErrBoth]	95	1		T254	4		T255	4		T256	3

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	86267	0		T108	896		T69	54		T71	131

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	86061	1		T108	896		T69	54		T71	131
values[1]	14	1		T255	1		T256	1		T358	1
values[2]	2	1		T354	2		-	-		-	-
values[3]	101	1		T254	3		T255	6		T256	2

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	86066	1		T108	896		T69	54		T71	131
values[1]	22	1		T254	1		T358	2		T353	2
values[2]	6	1		T352	2		T362	3		T361	1
values[3]	103	1		T254	2		T255	3		T256	2

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	85967	1		T108	896		T69	54		T71	131
auto[TlIntgErrCmd]	99	1		T254	4		T255	4		T256	5
auto[TlIntgErrData]	94	1		T254	3		T255	2		T256	2
auto[TlIntgErrBoth]	107	1		T254	3		T255	4		T256	3