4002b28ec4| Stage | Name | Tests | Max Job Runtime | Simulated Time | Passing | Total | Pass Rate |
|---|---|---|---|---|---|---|---|
| V1 | smoke | usbdev_smoke | 0.620s | 5.935us | 0 | 50 | 0.00 |
| V1 | csr_hw_reset | usbdev_csr_hw_reset | 0.840s | 50.268us | 5 | 5 | 100.00 |
| V1 | csr_rw | usbdev_csr_rw | 0.970s | 59.455us | 20 | 20 | 100.00 |
| V1 | csr_bit_bash | usbdev_csr_bit_bash | 10.050s | 1.185ms | 5 | 5 | 100.00 |
| V1 | csr_aliasing | usbdev_csr_aliasing | 3.570s | 313.868us | 5 | 5 | 100.00 |
| V1 | csr_mem_rw_with_rand_reset | usbdev_csr_mem_rw_with_rand_reset | 1.360s | 56.976us | 20 | 20 | 100.00 |
| V1 | regwen_csr_and_corresponding_lockable_csr | usbdev_csr_rw | 0.970s | 59.455us | 20 | 20 | 100.00 |
| usbdev_csr_aliasing | 3.570s | 313.868us | 5 | 5 | 100.00 | ||
| V1 | mem_walk | usbdev_mem_walk | 4.470s | 472.865us | 5 | 5 | 100.00 |
| V1 | mem_partial_access | usbdev_mem_partial_access | 2.370s | 157.120us | 5 | 5 | 100.00 |
| V1 | TOTAL | 65 | 115 | 56.52 | |||
| V2 | intr_test | usbdev_intr_test | 0.720s | 30.310us | 50 | 50 | 100.00 |
| V2 | tl_d_oob_addr_access | usbdev_tl_errors | 3.000s | 230.119us | 20 | 20 | 100.00 |
| V2 | tl_d_illegal_access | usbdev_tl_errors | 3.000s | 230.119us | 20 | 20 | 100.00 |
| V2 | tl_d_outstanding_access | usbdev_csr_hw_reset | 0.840s | 50.268us | 5 | 5 | 100.00 |
| usbdev_csr_rw | 0.970s | 59.455us | 20 | 20 | 100.00 | ||
| usbdev_csr_aliasing | 3.570s | 313.868us | 5 | 5 | 100.00 | ||
| usbdev_same_csr_outstanding | 1.470s | 109.767us | 20 | 20 | 100.00 | ||
| V2 | tl_d_partial_access | usbdev_csr_hw_reset | 0.840s | 50.268us | 5 | 5 | 100.00 |
| usbdev_csr_rw | 0.970s | 59.455us | 20 | 20 | 100.00 | ||
| usbdev_csr_aliasing | 3.570s | 313.868us | 5 | 5 | 100.00 | ||
| usbdev_same_csr_outstanding | 1.470s | 109.767us | 20 | 20 | 100.00 | ||
| V2 | TOTAL | 90 | 90 | 100.00 | |||
| V2S | tl_intg_err | usbdev_sec_cm | 1.010s | 162.058us | 5 | 5 | 100.00 |
| usbdev_tl_intg_err | 5.380s | 541.364us | 20 | 20 | 100.00 | ||
| V2S | sec_cm_bus_integrity | usbdev_tl_intg_err | 5.380s | 541.364us | 20 | 20 | 100.00 |
| V2S | TOTAL | 25 | 25 | 100.00 | |||
| V3 | TOTAL | 0 | 0 | -- | |||
| Unmapped tests | usbdev_stress_all_with_rand_reset | 0.610s | 5.887us | 0 | 50 | 0.00 | |
| usbdev_stress_all | 0.580s | 0 | 50 | 0.00 | |||
| TOTAL | 180 | 330 | 54.55 |
| Items | Total | Written | Passing | Progress |
|---|---|---|---|---|
| N.A. | 2 | 2 | 0 | 0.00 |
| V1 | 8 | 8 | 7 | 87.50 |
| V2 | 3 | 3 | 3 | 100.00 |
| V2S | 2 | 2 | 2 | 100.00 |
| SCORE | LINE | COND | TOGGLE | FSM | BRANCH | ASSERT | GROUP |
|---|---|---|---|---|---|---|---|
| 72.70 | 89.73 | 73.67 | 91.76 | 0.00 | 86.85 | 89.96 | 76.95 |
UVM_WARNING [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory. has 100 failures:
0.usbdev_stress_all_with_rand_reset.48395443927875811026002149367339956342381130812522427258368170934047402503395
Line 203, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_WARNING @ 5887151 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 5887151 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
1.usbdev_stress_all_with_rand_reset.5364374974083054876036475747315920689297418233191328775288422654074626458491
Line 203, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_WARNING @ 5887151 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 5887151 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
... and 48 more failures.
0.usbdev_stress_all.18935644138201674534855268670049677697914285445708923477843970564669002398328
Line 203, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_stress_all/latest/run.log
UVM_WARNING @ 0 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 0 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
1.usbdev_stress_all.81749758821978051690612067901368661941544290398574316742360779330206573767870
Line 203, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_stress_all/latest/run.log
UVM_WARNING @ 0 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 0 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
... and 48 more failures.
UVM_ERROR (usbdev_smoke_vseq.sv:12) virtual_sequencer [usbdev_smoke_vseq] FIXME has 50 failures:
0.usbdev_smoke.90011545606763120390287869982197034889159873564849255956296368670140307009328
Line 203, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_smoke/latest/run.log
UVM_ERROR @ 5935266 ps: (usbdev_smoke_vseq.sv:12) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_smoke_vseq] FIXME
UVM_INFO @ 5935266 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
1.usbdev_smoke.3165454964677521529348168723589077606831714182385249241460333078979500184395
Line 203, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_smoke/latest/run.log
UVM_ERROR @ 5935266 ps: (usbdev_smoke_vseq.sv:12) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_smoke_vseq] FIXME
UVM_INFO @ 5935266 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 48 more failures.