e3fb01b5e| Stage | Name | Tests | Max Job Runtime | Simulated Time | Passing | Total | Pass Rate |
|---|---|---|---|---|---|---|---|
| V1 | smoke | usbdev_smoke | 0.670s | 1.843us | 0 | 50 | 0.00 |
| V1 | csr_hw_reset | usbdev_csr_hw_reset | 0.790s | 23.811us | 5 | 5 | 100.00 |
| V1 | csr_rw | usbdev_csr_rw | 1.090s | 62.112us | 20 | 20 | 100.00 |
| V1 | csr_bit_bash | usbdev_csr_bit_bash | 9.210s | 1.521ms | 5 | 5 | 100.00 |
| V1 | csr_aliasing | usbdev_csr_aliasing | 3.500s | 372.448us | 5 | 5 | 100.00 |
| V1 | csr_mem_rw_with_rand_reset | usbdev_csr_mem_rw_with_rand_reset | 3.400s | 145.807us | 20 | 20 | 100.00 |
| V1 | regwen_csr_and_corresponding_lockable_csr | usbdev_csr_rw | 1.090s | 62.112us | 20 | 20 | 100.00 |
| usbdev_csr_aliasing | 3.500s | 372.448us | 5 | 5 | 100.00 | ||
| V1 | mem_walk | usbdev_mem_walk | 3.920s | 143.556us | 5 | 5 | 100.00 |
| V1 | mem_partial_access | usbdev_mem_partial_access | 2.270s | 200.580us | 5 | 5 | 100.00 |
| V1 | TOTAL | 65 | 115 | 56.52 | |||
| V2 | intr_test | usbdev_intr_test | 0.720s | 56.976us | 50 | 50 | 100.00 |
| V2 | tl_d_oob_addr_access | usbdev_tl_errors | 3.010s | 234.034us | 20 | 20 | 100.00 |
| V2 | tl_d_illegal_access | usbdev_tl_errors | 3.010s | 234.034us | 20 | 20 | 100.00 |
| V2 | tl_d_outstanding_access | usbdev_csr_hw_reset | 0.790s | 23.811us | 5 | 5 | 100.00 |
| usbdev_csr_rw | 1.090s | 62.112us | 20 | 20 | 100.00 | ||
| usbdev_csr_aliasing | 3.500s | 372.448us | 5 | 5 | 100.00 | ||
| usbdev_same_csr_outstanding | 9.320s | 10.141ms | 18 | 20 | 90.00 | ||
| V2 | tl_d_partial_access | usbdev_csr_hw_reset | 0.790s | 23.811us | 5 | 5 | 100.00 |
| usbdev_csr_rw | 1.090s | 62.112us | 20 | 20 | 100.00 | ||
| usbdev_csr_aliasing | 3.500s | 372.448us | 5 | 5 | 100.00 | ||
| usbdev_same_csr_outstanding | 9.320s | 10.141ms | 18 | 20 | 90.00 | ||
| V2 | TOTAL | 88 | 90 | 97.78 | |||
| V2S | tl_intg_err | usbdev_sec_cm | 10.110s | 10.006ms | 0 | 5 | 0.00 |
| usbdev_tl_intg_err | 10.900s | 10.010ms | 5 | 20 | 25.00 | ||
| V2S | sec_cm_bus_integrity | usbdev_tl_intg_err | 10.900s | 10.010ms | 5 | 20 | 25.00 |
| V2S | TOTAL | 5 | 25 | 20.00 | |||
| V3 | TOTAL | 0 | 0 | -- | |||
| Unmapped tests | usbdev_stress_all_with_rand_reset | 0.670s | 1.638us | 0 | 50 | 0.00 | |
| usbdev_stress_all | 0.650s | 0 | 50 | 0.00 | |||
| TOTAL | 158 | 330 | 47.88 |
| Items | Total | Written | Passing | Progress |
|---|---|---|---|---|
| N.A. | 2 | 2 | 0 | 0.00 |
| V1 | 8 | 8 | 7 | 87.50 |
| V2 | 3 | 3 | 2 | 66.67 |
| V2S | 2 | 2 | 0 | 0.00 |
| SCORE | LINE | COND | TOGGLE | FSM | BRANCH | ASSERT | GROUP |
|---|---|---|---|---|---|---|---|
| 69.76 | 69.43 | 63.91 | 87.42 | 0.00 | 74.05 | 97.77 | 95.72 |
UVM_WARNING [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory. has 100 failures:
0.usbdev_stress_all_with_rand_reset.1252848758
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_WARNING @ 2321097 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 2321097 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
1.usbdev_stress_all_with_rand_reset.422946739
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_WARNING @ 1817439 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 1817439 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
... and 48 more failures.
0.usbdev_stress_all.1971842382
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_stress_all/latest/run.log
UVM_WARNING @ 0 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 0 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
1.usbdev_stress_all.848618531
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_stress_all/latest/run.log
UVM_WARNING @ 0 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 0 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
... and 48 more failures.
UVM_ERROR (usbdev_smoke_vseq.sv:12) virtual_sequencer [usbdev_smoke_vseq] FIXME has 50 failures:
0.usbdev_smoke.680776798
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_smoke/latest/run.log
UVM_ERROR @ 3249262 ps: (usbdev_smoke_vseq.sv:12) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_smoke_vseq] FIXME
UVM_INFO @ 3249262 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
1.usbdev_smoke.3797910214
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_smoke/latest/run.log
UVM_ERROR @ 2358885 ps: (usbdev_smoke_vseq.sv:12) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_smoke_vseq] FIXME
UVM_INFO @ 2358885 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 48 more failures.
UVM_FATAL (cip_base_vseq.sv:601) [usbdev_common_vseq] timeout wait for alert handshake:fatal_fault has 11 failures:
0.usbdev_sec_cm.3713738191
Line 223, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_sec_cm/latest/run.log
UVM_FATAL @ 10004224567 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10004224567 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
3.usbdev_sec_cm.2151659935
Line 220, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/3.usbdev_sec_cm/latest/run.log
UVM_FATAL @ 10005530062 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10005530062 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 1 more failures.
0.usbdev_tl_intg_err.1636972216
Line 223, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_tl_intg_err/latest/run.log
UVM_FATAL @ 10008916352 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10008916352 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
2.usbdev_tl_intg_err.3477209735
Line 238, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/2.usbdev_tl_intg_err/latest/run.log
UVM_FATAL @ 10027659549 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10027659549 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 6 more failures.
UVM_ERROR (cip_base_vseq.sv:595) virtual_sequencer [usbdev_common_vseq] expect alert:fatal_fault to fire has 9 failures:
Test usbdev_sec_cm has 2 failures.
1.usbdev_sec_cm.985486542
Line 220, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_sec_cm/latest/run.log
UVM_ERROR @ 1905824 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 1905824 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
2.usbdev_sec_cm.2745268747
Line 223, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/2.usbdev_sec_cm/latest/run.log
UVM_ERROR @ 2466993 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 2466993 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
Test usbdev_tl_intg_err has 7 failures.
1.usbdev_tl_intg_err.32194823
Line 223, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_tl_intg_err/latest/run.log
UVM_ERROR @ 6468591 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 6468591 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
6.usbdev_tl_intg_err.3247968876
Line 226, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/6.usbdev_tl_intg_err/latest/run.log
UVM_ERROR @ 6951795 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 6951795 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 5 more failures.
UVM_FATAL (cip_base_vseq.sv:513) [usbdev_common_vseq] timeout occurred! has 2 failures:
6.usbdev_same_csr_outstanding.1411366262
Line 217, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/6.usbdev_same_csr_outstanding/latest/run.log
UVM_FATAL @ 10141338907 ps: (cip_base_vseq.sv:513) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout occurred!
UVM_INFO @ 10141338907 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
18.usbdev_same_csr_outstanding.3629762400
Line 216, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/18.usbdev_same_csr_outstanding/latest/run.log
UVM_FATAL @ 10091978708 ps: (cip_base_vseq.sv:513) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout occurred!
UVM_INFO @ 10091978708 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---